P.A. Kraus, T.C. Chua, K. Z. Ahmed, J. Campbell, F. Nouri & J. Cruse, Applied Materials, Sunnyvale, CA, USA, A. Rothschild, A. Veloso, S. Mertens & M. Schaekers, IMEC, Leuven, Belgium, F.N. Cubaynes, Philips Research Leuven, Leuven, Belgium, L. Date & R. Schreutelkamp, Applied Materials Belgium, Leuven, Belgium & T. M. Bauer, Sandia National Laboratories, Albuquerque, NM, USA
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