Online information source for semiconductor professionals
Value of an Optimized Test System for Advanced IC Design Validation, Characterization and Failure ..
Popular articles
Micron moving fast on Hynix in Q208 NAND flash rankings, says iSuppli - 19 August 2008
Numonyx to close California Technology Center - 12 August 2008
Qimonda starts major reorganization: exits PC DRAM market - 13 October 2008
Applied Materials sees higher CapEx spending for 2009 - 15 August 2008
Micron close to Inotera share purchase, says Gartner - 06 October 2008
ABSTRACT
As speed and logic density increase, device dimensions shrink, and transistor counts expand into the tens of millions, design and simulation tools are pushed beyond traditional models and the probability of achieving full design functionality, at speed, is greatly reduced. To move newer and more complex designs rapidly into production, there is a greater need to verify and characterize design performance in first silicon. Design complexity continues to challenge many aspects of IC production, but possibly its greatest impact is in design analysis, often referred to as engineering test.
 |
Please login to download the paper. No account yet? Please register. It's free! |