Online information source for semiconductor professionals

Critical component requirements for ALD technology

Popular articles

Voltaix names Peter Smith as CEO - 09 November 2011

Sematech Litho Forum: Sematech mulling multi-beam mask writer effort - 12 May 2010

TSMC hosts 2008 Green Forum on ‘green’ factories - 31 October 2008

Oberai discusses Magma’s move into solar PV yield management space - 29 August 2008

TSMC honors suppliers at annual Supply Chain Management Forum - 03 December 2008

Mark Osborne, Editor-in-Chief, Semiconductor Fabtech

ABSTRACT

Atomic Layer Deposition (ALD) has long been hailed as a next generation technology, enabling semiconductors to enter the nanoworld that promises to keep pace with the demands of Moore’s Law. Only in the last two years has this technology moved from the lab into the fab. The pace of adoption is expected to increase significantly at the 70nm node for DRAM and the 65-45nm nodes for logic. ALD is a variant of chemical vapor deposition (CVD) and therefore requires reactor and reactor-related components for operation under controlled vacuum conditions. However the demands are greater than with a typical CVD process. This has led to the need to develop components able to withstand the exacting requirements of ALD. Emphasis is also turning to the requirements of high volume production environments that include cost of ownership and mean time between failure issues. Here we investigate the latest developments in critical components for volume production ALD.

Download Please login to download the paper. No account yet? Please register. It's free!

Related jobs

No related jobs found, sorry!

Related articles

Synopsys and Mattson join forces on TCAD process simulation for CMOS processes - 16 July 2008

Windows NT-based Manufacturing Execution Systems - 01 March 1999

Important Aspects of DUV Optical Components - 01 June 2000

Advanced measurements for photoresist fundamentals - 01 December 2004

Tool order: Memory IC maker places follow-on order for Nanometrics metrology systems - 28 May 2009

Reader comments

No comments yet!

Post your comment

Name:
Email:
Please enter the word you see in the image below: