Product Briefing Outline: Ferro Electronic Material
Systems has introduced a patent-pending self-stopping chemical
mechanical planarization (CMP) slurry for Inner Layer Dielectric (ILD)
materials. Ferro claims the new slurry provides planarization
efficiency of > 95% with an increased over-polish window and
eliminates the need for endpoint detection. ‘SureStop' 8500 offers
improved efficiency and uniformity with lower defectivity compared to
standard ILD CMP slurries and is now being used to simplify
planarization processes that employ reverse mask etchback steps.
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Product Briefing Outline: Ferro Electronic Material
Systems has formulated patented high selectivity shallow trench
isolation (STI) CMP slurries with an optimized low defectivity ceria
particle that enable high-yield processes for next-generation devices.
‘TruPlane™ 8272' is performing successfully in high-volume
manufacturing of 65nm technology Flash devices, according to the
company.
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Product Briefing Outline: Cabot Microelectronics has
claimed a major breakthrough in its CMP technology with the ‘WIN'
platform of tungsten (W) CMP slurries for advanced technology nodes.
The WIN product line is non-hazardous and environmentally friendly as
it is based on hydrogen peroxide technology. The product platform is
composed of two main product classes: ‘WIN W7000' and ‘WIN W7300.'
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Product Briefing Outline: BOC Edwards has introduced
the ‘HELIOS 6' gas abatement solution that uses its unique inward-fired
combustion technology for high hydrogen flow processes, such as Si and
SiGe epitaxy, LPCVD tungsten and compound semiconductor MOCVD. Both the
HELIOS product line and the proprietary inward-fired combustor
technology that it incorporates are well-established industry
standards. BOC Edwards has installed hundreds of HELIOS systems and
thousands of combustors worldwide.
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Product Briefing Outline: ATMI has introduced a new
product line for 300mm wafer reclaim applications called ‘RegenSi Wafer
Reclaim Solutions.' ATMI's formulas are designed for dielectric removal
and are semi-aqueous, fluoride-based solutions with low viscosity, and
are therefore easily rinsed with water. They are designed to work with
either batch or single wafer spray tools.
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Product Briefing Outline: Toshiba Corporation,
Shibaura Mechatronics Corporation and Chlorine Engineers Corp. have
co-developed an innovative semiconductor resist stripping technology
that employs electrolyzed sulfuric acid. It is the first time that
electrolyzed sulfuric acid has been applied to resist stripping,
according to the companies. The partners have already developed a
single-wafer resist-stripping system that will be integrated into the
resist-stripping process at Toshiba's Yokkaichi Operations in April
2007.
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Product Briefing Outline: Cabot Microelectronics
Corporation has launched its new CMP polishing pad, the Epic D100,
which is the result of extensive research intended to deliver a step
change improvement in CMP pad life and pad-to-pad consistency.
Customers are successfully qualifying and using the Epic D100 for
dielectric, shallow trench isolation, tungsten and copper processes.
The new pad is already being used in production and is being evaluated
by multiple customers, according to the company.
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Product Briefing Outline: Mallinckrodt Baker is making
the BAKER CLk-870 residue remover available as a cost-effective wet
clean product designed to remove inorganic residue and post-etch/ash
polymer from 90nm single-wafer processes. According to Mallinckrodt
Baker, BAKER CLk-870 residue remover provides fast cleaning action and
low process temperatures, making it an ideal chemistry for silicon
nitride, copper and delicate low-k substrates.
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Product Briefing Outline: Rohm and Haas Electronic
Materials' CMP Technologies has introduced a number of new products in
two different product lines. The company has unveiled several new
additions to its ‘VisionPad' line of polishing pads as well as a new
series of ‘IC1000' pads known as ‘IC1000' AT series pads.
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Product Briefing Outline: Micro Photonics Inc. has
launched its new Sarfus visualization technology, a new optical
quantitative imaging technique for highly precise 3D thickness,
dimensional, roughness, profile and step height measurements. Sarfus
visualization is based on the perfect control of the reflection
properties of polarized light on a Surf (specific supporting plates
where the sample is deposited), which leads to an increase in the axial
sensitivity of the optical microscope by a factor of approximately 100
without reducing lateral resolution, according to the company. Specific
optical properties can be manipulated by controlling the layers
deposited on the substrate, and can be customized with specific top
layers such as SiO2, Au, Cr or Al.
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