Product Briefing Outline: Micro Photonics Inc. has
launched its new Sarfus visualization technology, a new optical
quantitative imaging technique for highly precise 3D thickness,
dimensional, roughness, profile and step height measurements. Sarfus
visualization is based on the perfect control of the reflection
properties of polarized light on a Surf (specific supporting plates
where the sample is deposited), which leads to an increase in the axial
sensitivity of the optical microscope by a factor of approximately 100
without reducing lateral resolution, according to the company. Specific
optical properties can be manipulated by controlling the layers
deposited on the substrate, and can be customized with specific top
layers such as SiO2, Au, Cr or Al.
Problem: Sarfus visualization results from a
significant increase of optical microscope sensitivity. To improve this
sensitivity, the technique enhances the contrast of the object as
compared to the background by minimizing the background intensity.
Solution:
Using an upright optical microscope and a Surf, a white light beam
passes through a linear polarizer which produces a linear polarized
light that is reflected by the Surf. The sample induces a change of the
polarization state. When the reflected beams pass through an analyzer
crossed with the polarizer, the light reflected from the surf is
stopped, while the light reflected from the sample passes through. An
infinitesimal quantity of matter deposited on the surface of the Surf
changes the property (i.e. modifies the polarization state) and reveals
the sample. The resulting high-contrast images allow direct observation
of nanometric thickness films or nanometric diameter objects. 2D images
can be converted into highly precise 3D metrological images, with
dimensional accuracy at <1nm. Roughness, profile extraction and step
height measurements are also easily imaged.
Applications:
Direct behavior and morphology characterization of nanotubes and
nanowires, and direct visualization of nanolithography patterns.
Platform: Sarfus
technology can be either integrated onto AFM or RAMAN spectroscopy
tools with a ‘plug and play' solution, or purchased as part of a total
acquisition system.
Availability: October 2006 onwards.