Online information source for semiconductor professionals
New Product: FEI launches first remote diagnostics program for microscopy tools
Popular articles
Micron moving fast on Hynix in Q208 NAND flash rankings, says iSuppli - 19 August 2008
Numonyx to close California Technology Center - 12 August 2008
Qimonda starts major reorganization: exits PC DRAM market - 13 October 2008
Micron close to Inotera share purchase, says Gartner - 06 October 2008
Applied Materials sees higher CapEx spending for 2009 - 15 August 2008
Product Briefing Outline: FEI has introduced a Remote
Access Program for Interactive Diagnostics (RAPID) via its customer
service organization that is designed to improve service support times
and optimize tool uptime. The RAPID program is first being made
available to FEI customers in North America and will soon be extended
worldwide, according to the company.
Problem: The remote diagnostics program, the first of
its kind in the microscopy industry, will be able to solve many system
problems remotely, eliminating the need for an on-site service call.
If it is determined that replacement parts are needed, field engineers
will be able to order them in advance of their service visit, thus
shortening the overall time to repair.
Solution:
With RAPID remote diagnostics, FEI service engineers will now be able
to run service test software and diagnostics on systems that are
equipped for RAPID whenever a customer initiates a service call and the
remote diagnostics protocol. With the program, tool settings can be
checked and modified, and software can be patched and upgraded as
needed. FEI engineers can also view images from the microscope and
make performance assessments. The RAPID remote diagnostics' connection
is secure and can only be initiated from the customer's location. A
secure portal located outside of FEI's main corporate network maintains
a minimum number of outside ports and manages all connections between
customer instruments and FEI remote service engineers. Customer systems
are fully isolated from each other and communicate with the secure
portal using an encrypted virtual private network (VPN) connection.
Applications:
The majority of systems within FEI's Titan, Tecnai, Nova, Strata,
Quanta, Helios and Inspect families of microscopes are RAPID
compatible. Many older products may also be supported - either "as
is," with a system upgrade or with the addition of a support PC.
Existing customers with service agreements can obtain RAPID software
from FEI's field service engineers.
Platform: Encrypted virtual private network (VPN)
Availability: May 2007 onwards.
