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Tool Order: Nova wins metrology orders from three separate customers

23 June 2009 | By Mark Osborne | News > Wafer Processing

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New orders from three different customers, all for its stand-alone NovaScan metrology tool have set a new quarterly record in bookings for Nova Measuring Instruments. The tools are to be utilized for Optical CD and thin film measurements in CMP, FEOL and BEOL etch as well as deposition at advanced technology nodes, down to 45nm. The Company expects to deliver and install the ordered tools within the second and third quarters of 2009 fiscal year.

"This is clearly a significant milestone for the Company," said Gabi Seligsohn, President and CEO of Nova. "We set out to prove that we have a valuable technology for semiconductor manufacturers and our penetration efforts are bearing fruit. The stand-alone market represents a meaningful growth engine for Nova, especially in light of the average selling prices, which are significantly higher than in the integrated metrology segment. The diversity of customers, as well as the deployment at different process steps both in production and in R&D, demonstrates that we are well positioned to grow our stand-alone market share as the industry continues to recover from the current downturn. I appreciate the fact that this achievement is also due to the confidence of our customers in Nova and I look forward to continue providing them with innovative technologies and dedicated support."

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