Online information source for semiconductor professionals
Tool order: Nova gains new DRAM customer for standalone optical CD metrology systems
Popular articles
â??Velocityâ?? the new buzzword in Intelâ??s PQS annual awards - 12 April 2012
Oberai discusses Magma’s move into solar PV yield management space - 29 August 2008
Applied Materials adds Jim Rogers to Board of Directors - 29 April 2008
TSMC honors suppliers at annual Supply Chain Management Forum - 03 December 2008
New Product: Applied Materials new EUV reticle etch system provides nanometer-level accuracy - 19 September 2011
Nova Measuring Instruments has added a large DRAM manufacturer to its customer base. The standalone order for an optical CD metrology system is part of a multimillion dollar deal and includes multiple integrated metrology optical CD systems. Most of the purchased items will be shipped during the second and third quarters of this year.
“This additional customer acquisition further solidifies our market position, and is of strategic importance, given our expectation that in the near future Optical CD will play a more significant role in DRAM manufacturing,” commented Noam Shintel, Nova’s director of corporate marketing. “This particular customer will be deploying a combination of our integrated and stand alone metrology solutions for thin film and optical CD measurements, at advanced technology nodes in Etch, CVD and CMP.”