Metrology company Nanometrics, Inc. has received a follow-on order for one of its Lynx cluster metrology systems from an unnamed DRAM and Flash memory manufacturer. The Lynx platform enables customers to leverage numerous process control technologies for monitoring steps throughout the manufacturing process and was equipped with 9010 metrology to support Optical Critical Dimension (OCD) metrology processes.
“This customer had originally ordered this Lynx system on an expedited basis in 2008, but subsequently cancelled the purchase in response to the deteriorating market environment at the end of last year,” explained Tim Stultz, President and CEO, Nanometrics, Inc. “The recent re-issue of the purchase order and request for immediate insertion into a high-volume production line is evidence of the importance of our technology to support the ramp of this customer’s next-generation memory devices.”