A U.S.-based GaAs IC manufacturer has placed a follow-on order with Metryx, Limited, for its Mentor OC23 mass metrology system, which will be used for measuring measure both deposition and etch processes in the fabrication of volume bulk acoustic wave (BAW) devices on product wafers.
“In addition to being highly effective, mass metrology delivers considerable time and cost benefits. That is the basis for initial purchase orders," stated Dr. Adrian Kiermasz, President and CEO of Metryx. “Once the machine is in the production line, manufacturers can truly evaluate the effectiveness of the technology. To date, 95 percent of our customers have placed follow-on orders. We see that as an indication of mass metrology’s increasing value in the volume production environment."