Online information source for semiconductor professionals

Tool Order: GaAs IC manufacturer placed follow-on order with Metryx for mass metrology system

21 April 2009 | By Mark Osborne | News > Wafer Processing

Popular articles

Oberai discusses Magma’s move into solar PV yield management space - 29 August 2008

‚??Velocity‚?? the new buzzword in Intel‚??s PQS annual awards - 12 April 2012

Applied Materials adds Jim Rogers to Board of Directors - 29 April 2008

TSMC honors suppliers at annual Supply Chain Management Forum - 03 December 2008

Sematech Litho Forum: Sematech mulling multi-beam mask writer effort - 12 May 2010

Mentor OC23 mass metrology systemA U.S.-based GaAs IC manufacturer has placed a follow-on order with Metryx, Limited, for its Mentor OC23 mass metrology system, which will be used for measuring measure both deposition and etch processes in the fabrication of volume bulk acoustic wave (BAW) devices on product wafers.

“In addition to being highly effective, mass metrology delivers considerable time and cost benefits. That is the basis for initial purchase orders," stated Dr. Adrian Kiermasz, President and CEO of Metryx. “Once the machine is in the production line, manufacturers can truly evaluate the effectiveness of the technology. To date, 95 percent of our customers have placed follow-on orders. We see that as an indication of mass metrology’s increasing value in the volume production environment."

Related articles

Metryx extends sales and support into Asia - 07 May 2008

Tool Order: Metryx reports improving acceptance of mass metrology for 300mm production - 16 July 2010

Metryx, UK mass metrology supplier, wins second Queen‚??s Award - 29 April 2008

Metryx to collaborate with Intel and imec on mass metrology applications at the 20nm node - 14 June 2011

Tool order: Leading memory manufacturer receives follow-on Lynx System from Nanometrics - 20 May 2009

Reader comments

No comments yet!

Post your comment

Please enter the word you see in the image below: