Online information source for semiconductor professionals

Semilab buys another metrology company

30 June 2009 | By Mark Osborne | News > Wafer Processing

Popular articles

New Product: Applied Materials new EUV reticle etch system provides nanometer-level accuracy - 19 September 2011

Oberai discusses Magma’s move into solar PV yield management space - 29 August 2008

‚??Velocity‚?? the new buzzword in Intel‚??s PQS annual awards - 12 April 2012

Applied Materials adds Jim Rogers to Board of Directors - 29 April 2008

New Product: ASML Brion‚??s Tachyon MB-SRAF enables OPC-like compute times - 19 September 2011

The list of metrology equipment supplier acquisitions at Semilab continues to lengthen with the announcement that it has purchased privately held Semiconductor Diagnostics, Inc. (SDI) for an undisclosed sum. SDI, based in Tampa, Florida is known for its range of non-contact measurement solutions was founded in 1988 and has 380 systems installed in fabs worldwide. SDI had also started offering services to the PV industry, a growing focus for Semilab.

“The acquisition of SDI provides Semilab with another key offering for non-contact metrology and give us critical mass as a source single vendor,” said Dr. Tibor Pavelka, President and Chief Executive Officer of Semilab. “SDI is the premier provider of surface photo voltage technology for the non-contact, non-destructive measurement of wafers and ICs. With strength around iron and copper contamination, the products meet the needs for manufacturing products such as the image sensors used in cell phones and solar cells.”

SDI will operate as an independent company, Semilab SDI an LLC of Semilab-USA. VP of Sales and Marketing at SDI, Andrew Findlay will assume the role of General Manager of the unit.

Semilab has now purchased 6 companies in recent years, which include QC Solutions, AMS, SOPRA SA, SSM and Boxer Cross from Applied Materials.

Related articles

Semilab aquires materials metrology specialist SOPRA - 29 September 2008

Metrology market consolidation marches on - 01 April 2009

Jordan Valley claims 10% sales growth in 2009 - 22 March 2010

ODP for post-lithography metrology of 3D structures - 01 March 2005

Tool Order: Rudolph receives multiple system orders for ‚??MetaPULSE-G‚?? metrology system - 07 February 2011

Reader comments

No comments yet!

Post your comment

Please enter the word you see in the image below: