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Nanometrics enters photovoltaics market with acquisition of Tevet

08 May 2008 | By Mark Osborne | News > Wafer Processing

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NanometricsNanometrics said in a brief statement that it had acquired Tevet Process Control Technologies, an Israel-based film thickness integrated metrology (IM) tool supplier. The deal was an all-cash transaction but further details were not disclosed.

Tevet was supported by venture capital funding. In July 2007 the metrology company had raised over $13 million to support the development of its Trajectory T3 film thickness integrated metrology product line that was used in PECVD processes.

“The new IM products are differentiated and highly complementary to our IM business,” commented Steve Bradley, Director of the Integrated Metrology Business Unit at Nanometrics. “This represents an additional entry point for us with leading semiconductor OEMs, as well as companies in the solar manufacturing industry.”

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