Online information source for semiconductor professionals

Milestone: Nova installs 100th metrology tool in South Korea

28 April 2008 | By Síle Mc Mahon | News > Wafer Processing

Popular articles

Oberai discusses Magma’s move into solar PV yield management space - 29 August 2008

Samsung and Micron gain most market share in DRAM crisis - 17 February 2009

TSMC hosts 2008 Green Forum on ‘green’ factories - 31 October 2008

Micron moving fast on Hynix in Q208 NAND flash rankings, says iSuppli - 19 August 2008

Numonyx to close California Technology Center - 12 August 2008

NovaNova Measuring Instruments has said it has reached a new company milestone with the the installation of its 100th NovaScan Optical Metrology system in South Korea. The company said it had now installed more than 650 NovaScan 300mm Optical CD and thin-film metrology systems worldwide.

"The NovaScan systems were chosen by our Korean customers after demonstrating benchmark precision and fleet matching. Once installed, outstanding reliability of more than 224,000 wafers between failures was achieved," said Buck Kim, President of Nova's Asia Pacific subsidiary. "The success in the South Korean market is a milestone for Nova, as Korean customers are highly demanding. We believe that we are in a good position to continue leveraging our installed base in this key market and further extend our penetration" added Mr. Kim.

Related jobs

No related jobs found, sorry!

Related articles

Tool Order: Nova notes 5 new customers and 7 separate multiple metrology installs - 08 July 2010

Tool Order: Nova wins metrology orders from three separate customers - 23 June 2009

Tool Order: Nova gets follow-on orders from major foundry in China - 04 March 2008

Tool Order: Nova’s optical CD metrology system becomes ‘tool of record’ at major foundry - 29 September 2009

Tool order: Nova gains new DRAM customer for standalone optical CD metrology systems - 14 June 2010

Reader comments

No comments yet!

Post your comment

Name:
Email:
Please enter the word you see in the image below: