Online information source for semiconductor professionals

Metryx, UK mass metrology supplier, wins second Queen‚??s Award

Popular articles

New Product: Applied Materials new EUV reticle etch system provides nanometer-level accuracy - 19 September 2011

Oberai discusses Magma’s move into solar PV yield management space - 29 August 2008

‚??Velocity‚?? the new buzzword in Intel‚??s PQS annual awards - 12 April 2012

Applied Materials adds Jim Rogers to Board of Directors - 29 April 2008

New Product: ASML Brion‚??s Tachyon MB-SRAF enables OPC-like compute times - 19 September 2011

MetryxMetryx has won the UK Queen’s Award, for the second year in a row, this time in the Innovation category. Representatives from Metryx will attend three separate ceremonies to accept their award, which include a trip to Buckingham Palace in the presence of Her Royal Highness Queen Elizabeth.

 “We have experienced tremendous growth over the past six years due to the acceptance of our innovative mass metrology technology,” noted Dr. Adrian Kiermasz (pictured), CEO of Metryx. “It is a great honor to have the technology recognized with the Queen’s Award, and complements our 2007 Queen’s Award for International Trade. Recognition for Innovation, in particular, highlights the clear benefits that mass metrology brings to semiconductor manufacturing.”

“In 2001, we set out to identify where there were clear holes in the semiconductor manufacturing process that may present an opportunity to bring something new to market,” added Rob Wilby, Metryx CTO and co-founder. “We identified metrology as an area of opportunity, and looked at it as a simple problem requiring a simple approach. By applying the theory of mass, we were able to develop a truly innovative technology that has had a significant impact on the process. It is a testament to the team here to bring that vision to reality and be recognized in such a distinguished way.”

Metryx won its first Queen’s Award in the International Trade category in 2007.

Related articles

Tool Order: GaAs IC manufacturer placed follow-on order with Metryx for mass metrology system - 21 April 2009

Metryx to collaborate with Intel and imec on mass metrology applications at the 20nm node - 14 June 2011

Tool Order: Metryx reports improving acceptance of mass metrology for 300mm production - 16 July 2010

Metryx extends sales and support into Asia - 07 May 2008

Chartered Semiconductor selects best suppliers in 2008 - 20 March 2009

Reader comments

No comments yet!

Post your comment

Please enter the word you see in the image below: