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Metryx, UK mass metrology supplier, wins second Queen’s Award

29 April 2008 | By Síle Mc Mahon | News > Wafer Processing

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MetryxMetryx has won the UK Queen’s Award, for the second year in a row, this time in the Innovation category. Representatives from Metryx will attend three separate ceremonies to accept their award, which include a trip to Buckingham Palace in the presence of Her Royal Highness Queen Elizabeth.

 “We have experienced tremendous growth over the past six years due to the acceptance of our innovative mass metrology technology,” noted Dr. Adrian Kiermasz (pictured), CEO of Metryx. “It is a great honor to have the technology recognized with the Queen’s Award, and complements our 2007 Queen’s Award for International Trade. Recognition for Innovation, in particular, highlights the clear benefits that mass metrology brings to semiconductor manufacturing.”

“In 2001, we set out to identify where there were clear holes in the semiconductor manufacturing process that may present an opportunity to bring something new to market,” added Rob Wilby, Metryx CTO and co-founder. “We identified metrology as an area of opportunity, and looked at it as a simple problem requiring a simple approach. By applying the theory of mass, we were able to develop a truly innovative technology that has had a significant impact on the process. It is a testament to the team here to bring that vision to reality and be recognized in such a distinguished way.”

Metryx won its first Queen’s Award in the International Trade category in 2007.

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