Online information source for semiconductor professionals

KLA-Tencor to acquire Vistec‚??s inspection unit

31 July 2008 | By Mark Osborne | News > Wafer Processing

Popular articles

Oberai discusses Magma’s move into solar PV yield management space - 29 August 2008

New Product: Applied Materials new EUV reticle etch system provides nanometer-level accuracy - 19 September 2011

‚??Velocity‚?? the new buzzword in Intel‚??s PQS annual awards - 12 April 2012

Applied Materials adds Jim Rogers to Board of Directors - 29 April 2008

TSMC honors suppliers at annual Supply Chain Management Forum - 03 December 2008

VistecThe Microelectronic Inspection Equipment (MIE) business unit of Vistec Semiconductor Systems is to be purchased by KLA-Tencor from Vistec’s owner, Golden Gate Capital, a San Francisco-based private equity firm. Financial terms of the transaction were not disclosed.

“The Microelectronic Inspection Equipment division of Vistec not only complements KLA-Tencor’s product portfolio, it will give us an opportunity for growth into new segments of the mask and wafer markets. Vistec’s mask registration measurement systems will enable us to offer an expanded range of products that provide increased operational benefits to our customers,” said Rick Wallace, CEO of KLA-Tencor. “With its heritage as part of the Leica group, Vistec has a deep technology foundation that will be a good fit with KLA-Tencor’s culture of innovation in optics and other advanced technologies.”

The transaction is subject regulatory approvals, and is expected to close before the end of the year.

Related articles

Dr. Ben Tsai joins Ultratech Board of Directors - 15 October 2009

Top 5 new products for 2008 - 29 December 2008

New Product: Wafer Plane Inspection technology from KLA-Tencor addresses 32nm mask defect challenges - 14 April 2008

Qcept Technologies taps former KLA-Tencor Asia president - 21 June 2011

Putting the Web to Work on Quality Control - 01 June 2000

Reader comments

No comments yet!

Post your comment

Name:
Email:
Please enter the word you see in the image below: