Online information source for semiconductor professionals

Jordan Valley acquires Metrosol

23 March 2010 | By Mark Osborne | News > Wafer Processing

Popular articles

New Product: Applied Materials new EUV reticle etch system provides nanometer-level accuracy - 19 September 2011

Oberai discusses Magma’s move into solar PV yield management space - 29 August 2008

‚??Velocity‚?? the new buzzword in Intel‚??s PQS annual awards - 12 April 2012

Applied Materials adds Jim Rogers to Board of Directors - 29 April 2008

New Product: ASML Brion‚??s Tachyon MB-SRAF enables OPC-like compute times - 19 September 2011

Consolidation within the semiconductor metrology market continues with another acquisition by Jordan Valley of Vacuum Ultra Violet (VUV) metrology tool firm, Metrosol, based in Austin Texas. Jordan Valley had previously acquired X-ray rival Bede. Financial details were not disclosed.

"The acquired VUV technology will strengthen Jordan Valley's position as a key metrology solutions provider for the sub 45nm semiconductors processes while expanding its capabilities to new markets such as the emerging patterned HDD market," commented Isaac Mazor, Jordan Valley CEO.

Metrosol's short wavelength VUV technology is claimed to offer better and tighter process control on product wafers at a throughput suitable for high-volume manufacturing and is claimed to have higher sensitivity for ultra thin FEOL layers such as high-k dielectric and metal gates.

Related articles

Tool Order: Samsung Electronics selects Jordan Valley’s X-ray metrology system - 18 May 2009

Meir Mimon steps into Jordan Valley‚??s Vice President of Sales and Marketing role - 18 June 2008

Jordan Valley claims 10% sales growth in 2009 - 22 March 2010

Jordan Valley acquires Bede X-Ray Metrology - 16 April 2008

Tool Order: Jordan Valley wins X-ray metrology tool order for copper processing - 16 December 2009

Reader comments

No comments yet!

Post your comment

Please enter the word you see in the image below: