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Jordan Valley acquires Metrosol

23 March 2010 | By Mark Osborne | News > Wafer Processing

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Consolidation within the semiconductor metrology market continues with another acquisition by Jordan Valley of Vacuum Ultra Violet (VUV) metrology tool firm, Metrosol, based in Austin Texas. Jordan Valley had previously acquired X-ray rival Bede. Financial details were not disclosed.

"The acquired VUV technology will strengthen Jordan Valley's position as a key metrology solutions provider for the sub 45nm semiconductors processes while expanding its capabilities to new markets such as the emerging patterned HDD market," commented Isaac Mazor, Jordan Valley CEO.

Metrosol's short wavelength VUV technology is claimed to offer better and tighter process control on product wafers at a throughput suitable for high-volume manufacturing and is claimed to have higher sensitivity for ultra thin FEOL layers such as high-k dielectric and metal gates.

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