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Jordan Valley acquires Bede X-Ray Metrology

16 April 2008 | By Síle Mc Mahon | News > Wafer Processing

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BedeBede X-Ray Metrology has been taken over by Israel-based Jordan Valley Semiconductor effective as of April 14th, 2008. Bede, a supplier of HRXRD metrology for the semiconductor industry, entered into the Administration phase at the end of March and its assets have now been taken over by Jordan Valley. 

Insolvency administrators have been appointed to oversee the company’s finances, and it is not expected that the administration will result in any return to equity shareholders.

Bede first announced that it was involved in preliminary takeover talks in July 2007.

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