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35th Edition: Enabling operational excellence through an integrated manufacturing IT baseline Print E-mail
Sep 18, 2007 at 03:04 PM

Reiner Missale, Qimonda AG, Germany
 
ABSTRACT 

300mm technology has forced the semiconductor industry to take a broader perspective on the classical understanding of production and Shop-Floor Control. As a consequence, the focus shifted from the perspective of Transport Automation and Manufacturing Execution Systems to the integrated Factory, viewing all involved elements for semiconductor production. In pre-300mm, the process-engineering domain saw limited overlap to production logistic and transport. Today the linkage and integration of process control and shop-floor control and production logistic is acknowledged as a key factor for operational excellence. These are the Enabling Technologies for the high-end “Manufacturing Operations Management”.

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33rd Edition: Time synchronization solutions Print E-mail
Apr 10, 2007 at 12:39 PM

By Gino Crispieri, ISMI, Texas

ABSTRACT

Timing requirements placed on maunfacturing systems are becoing increasingly stringent in the semiconductor industry.  Traditionally, these manufacturing systems have been implemented in a centralized architecture in which the timing constraints were met by paying careful attention to programming combined with the use of communication technologies with deterministic latency.

In recent years, an increasing number of manufacturing systems have used distributed computer architectures and relied on mainstream networking technologies.  In particular, Ethernet-based communications are becoming more common in manufacturing applications.  This has led to alternative means for enforcing the timing requirements in such systems.  One such technique is the use of system components that contain real-time clocks, all of which are synchronized to each other within the networked system.

 

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32nd Edition: Short-interval detailed production scheduling in 300mm semiconductor manufacturing... Print E-mail
Dec 20, 2006 at 05:15 PM

Robert Bixby, ILOG Inc., & Rich Burda & David Miller, IBM, USA

ABSTRACT

Fully automated 300mm manufacturing requires the adoption of a real-time lot-dispatching paradigm. Automated dispatching has provided significant improvements over manual dispatching by removing variability from the thousands of dispatching decisions made every day in a fab. Real-time resolution of tool queues, with consideration of changing equipment states, process restrictions, physical and logical location of WIP, supply chain objectives and a myriad of other parameters, is required to ensure successful dispatching in the dynamic fab environment.

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31st Edition: Discussion topic: Interface A and the road to adoption Print E-mail
Sep 29, 2006 at 02:36 PM

Discussion panel: Harvey Wohlwend, Manager, ISMI; Mark Pendleton, Principal Software Architect, Asyst Technologies; Michael Arnold, Managing Director and Program Manager of fab services, PEER Group.

ABSTRACT

Building, ramping and operating 300mm fabs takes significant capital expenditure that puts pressure on all concerned to rapidly achieve desired returns on investment.  The ability to rapidly ramp with sustainable high yields has become an essential aspect of 300mm fab operations.  Interface A was conceived by the semiconductor industry to address important aspects of tool/process data collection that previous standards (SEC/GEM) were not designed to effectively handle.  With experience garnered from the standards' efforts to migrate to 300mm wafer processing, Interface A has been developed in quicker time with less revisions.  However, the adoption of this vastly superior data port technology in 300mm fabs has not mirrored the pace of its development cycle.  This discussion panel article brings together key players in the development and deployment of Interface A in an effort to understand how far down the road it is to fab-wide adoption.

Mark Osborne, Editor-in-Chief, Semiconductor Fabtech

 

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30th edition: The status and future of copper CMP technology and consumables need Print E-mail
Jun 25, 2006 at 06:53 PM

Michael Corbett & Mark Thirsk, Linx Consulting LLC,USA

ABSTRACT

Today, most new logic and ASIC devices are being implemented with multiple copper interconnect layers put down with a dual damascene approach. This article will examine the state-of-the-art in copper CMP polishing for the 90nm node that is currently being ramped into highvolume manufacturing, and look forward to the challenges, needs and trends for the implementation of 65nm and 45nm half-pitch devices.  We also analyze forecasts of unit operations, discuss the dynamics within the supply side of the CMP consumable industry, and look at how novel technologies such as ECMP may impact both users and suppliers. 

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29th Edition: Discussion topic: Double Patterning technical concerns Print E-mail
Mar 09, 2006 at 09:27 AM

The discussion topic format is new to Semiconductor Fabtech. It consists of individual experts in a field providing separate comment on a major technology issue. All contributors' views are presented separately and formatted clearly to show the differences compared to a co-authored style paper.

Walt Trybula, The Trybula Foundation Inc., & Brian Grenon, Grenon Consulting, Christian K. Kalus, SIGMA-C, Nigel Farrar,Cymer Inc., Frank D. Masciocchi, Litel Instruments, Martin McCullum, Nikon Precision Europe, Mircea Dusa, ASML, Rainer Pforr, Infineon Technologies.

ABSTRACT
As the lithography is both the most costly and critical process towards fully functioning semiconductor devices, it is obvious that developments within the lithography field are closely followed and analyzed. This year at the SPIE Microlithography Conference it became clear that a major shift in lithography tool and process techniques is required to continue scaling as befits Moore's Law. EUV lithography is not going to be ready for Intel's needs at the 32nm node while immersion lithography has not ‘matured' enough for the chip giant to ‘risk' production for its introduction of 45nm node IC devices. Instead, Intel plans to retain the use of ‘dry' 193nm ArF DUV tools, while adopting a Double Patterning (DP) imaging regime through to the 32nm node. Although there are various DP strategies possible, few experts in the field believe that some form of throughput, cycle-time and cost impact on fab operations will not occur. Although not all leading-edge IC manufacturers may pursue a DP strategy, it would now seem certain that everyone will need to look deeply into the pros and cons before making such critical manufacturing decisions. We are very pleased to have been able to assemble in this discussion piece, a group of experts within the lithography discipline to cover some of the key issues surrounding DP strategies, especially at such short notice, so soon after the SPIE Conference. 

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28th Edition: Increasing factory efficiency, an in-depth look at tool- and wafer-level control Print E-mail
Dec 14, 2005 at 04:34 PM

Matthew Purdy, Advanced Micro Devices, Austin, TX, USA

ABSTRACT

The economics of bringing a new, 300mm semiconductor factory online are enormous, with capital costs in the billions of dollars. Such large initial capital outlays in the highly competitive semiconductor industry require a rapid return on investment. Such a return can only be done by operating factories at high levels of efficiency and predictability. 

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27th Edition: Impact of single-wafer clean on manufacturing efficiency – fab perspective Print E-mail
Aug 21, 2005 at 10:22 AM

Ashwin Ghatalia, Kranthi Adusimilli, Dave Dyer, Walter Worth, Robert Wright, Phil Naughton, Joel Barnett & Steve Burnett, International SEMATECH, Austin, Texas

ABSTRACT

The International Technology Roadmap for Semiconductors (ITRS) lists several major challenges for IC factory integration. Two of them are factory flexibility and management of factory complexity. This article compares single-wafer clean to current batch processes from an overall IC factory perspective. Tools, factory-level investments, facilities, cycle time, factory logistical impacts and environmental issues are addressed. The influence of different equipment configurations is also investigated. 

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26th Edition: 300mm fab automation: Towards 7th heaven Print E-mail
Jun 21, 2005 at 10:18 AM

Mark Osborne, Editor-in-Chief, Semiconductor Fabtech

ABSTRACT

During the 16th Annual IEEE/ SEMI Advanced Semiconductor Manufacturing Conference, held during SEMICON Europa, 11-12th of April 2005, presentations from Intel, in particular, provided insight into the constantly evolving world of 300mm fab automation. The drive towards fully integrated and highly automated operations to improve cycle times, yield and overall manufacturing efficiencies is seen as a competitive advantage. We review the key presentations at this years ASMC Conference that discussed 300mm fab automation practisesand future developments. 

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25th Edition: IC market trends in 2005 - Picking the positives Print E-mail
Feb 20, 2005 at 10:14 AM

Mark Osborne, Editor-in-Chief, Semiconductor Fabtech

ABSTRACT

During every January the major market forecasting firms and their leading market analysts present their forecasts of the semiconductor industry for the year ahead.With 2004 proving to be a very good year for the industry it is rather surprising that a good deal of pessimism about 2005 is evident. A round up of 2005 projections put the majority of forecasters in the pessimistic bracket while two forecasters in particular buck this trend with strong optimistic projections for the year ahead. Though its long been said, that "bad news sells newspapers," we focus attention on the two optimistic forecasts (Future Horizons, VLSI Research) for reasons that are not as obvious as you would think!

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10th Edition: A Planning and Control Model for Customer-Oriented IC Development and Manufacturing Print E-mail
Feb 03, 2005 at 04:30 PM
FRANK FRAUENHOFFER & ROLAND STURM, Fraunhofer Institute Manufacturing Engineering and Automation (FhG-IPA),
Stuttgart, Germany
GEORG MÖNCH, MARIO VON PODEWILS, KNUD RICHTER & VOLKER SCHMALFUß, Thesys Gesellschaft für Mikroelektronik mbH, Erfurt,
Germany

ABSTRACT

Within the last 15 years many semiconductor enterprises have introduced CIM concepts successfully. The main effort was spent on the development and introduction of manufacturing execution systems (MES) also known as computer aided manufacturing systems (CAM) or shop floor control systems (SFC).Write Comment (0 comments)
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10th Edition: A New Low Cost Approach in 200 mm and 300 mm AMHS Print E-mail
Feb 03, 2005 at 04:28 PM
THOMAS ARZT, Clean Room Consulting GmbH, Freiburg, Germany
FREDDY BULCKE, eFBe International Marketing and Engineering Consultancy bvba, Belgium

ABSTRACT

There has been quite some speculation in the semiconductor industry recently with regard to the transition to 300 mm wafer fabs. In the meantime, it seems obvious that the ambitious time schedule will experience some changes and a severe delay. This delay in the launching of 300 mm wafer fabs forces the semiconductor industry to consider further improvements of 200 mm automation scenarios both in CIM/MES and AMHS.Write Comment (0 comments)
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10th Edition: The Impact of Conveyor Transports on Factory Performance at Infineon’s 200-mm Fab Print E-mail
Feb 03, 2005 at 04:25 PM
HARALD HEINRICH, Infineon Technologies, Dresden GmbH & Co. OHG, Dresden, Germany
ADRIAN PYKE, Middlesex General Industries Inc., Woburn, MA, USA

ABSTRACT

The first large-scale application of a conveyor based transport network in front-end manufacturing is discussed. The network design unifies the inter and intra bay WIP delivery for the first time. Its rationale lies in better performance of the Factory Operating Characteristic Curve (cycle time vs. tool utilization).
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24th Edition: From boom to bust before you even knew it happened! Print E-mail
Dec 11, 2004 at 06:13 PM

Len Jelinek, iSuppli Corp.

ABSTRACT

Semiconductor investors and industry watchers began 2004 with high expectations. As they saw it, the chip market was a depressed sector that had a strong outlook and that promised increasing demand and limited supply. With bullish forecasts, rising average selling prices (ASPs) and increased profitability for chipmakers, what could go wrong?  But before you could say déjà vu 2000, market conditions changed - and sentiment among industry participants quickly soured. 

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24th Edition: Management cost per function reduction in manufacturing Print E-mail
Dec 11, 2004 at 02:55 PM

John E.J. Schmitz, Chief Operating Officer, Manufacturing Technology, International SEMATECH Manufacturing Initiative, Austin, Texas, USA

ABSTRACT

This article discusses the escalating costs associated with manufacturing advanced electronic circuits. Emanufacturing will have to play a much larger role in this manufacturing if the requirements are to be met on schedule. It is concluded that all players in semiconductor manufacturing will have to adopt this approach if they are to remain competitive. 

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24th Edition: Worldwide capital-spending trends Print E-mail
Dec 11, 2004 at 12:00 AM

Bill McClean, President IC Insights, Inc, Scottsdale, AZ, USA

ABSTRACT

Figure 1 provides worldwide capital spending trends from 1995 through 2003 and a forecast for 2004 through 2008. As shown, semiconductor industry capital spending is not expected to exceed 2000's level until the peak of the next IC industry cycle in 2008! When looking at the per cent change line in Figure 1, it is evident that IC insights believes that the historically volatile trends in capital spending outlays will continue through 2008. 

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23rd Edition: Easing the transition to 300-mm wafer fabrication Print E-mail
Sep 21, 2004 at 02:53 PM

Thomas J. Sonderman, Advanced Micro Devices, Austin, TX, USA

ABSTRACT

The demands on semiconductor manufacturers have never been greater than they are today. Companies are challenged to meet market demand by delivering increasingly sophisticated products in high volume, on time and more cost-effectively than ever before. The economy of scale makes a conversion to 300-mm wafers ultimately beneficial, but there is an inherent risk associated with the transition. With the value of each 300-mm wafer more than double that of 200-mm wafers, 300-mm manufacturing demands a level of process improvement that effectively keeps costs low while maximizing the value of each wafer.

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22nd Edition: Best practices for wafer-fab cycle-time management – tool uptime Print E-mail
Jul 19, 2004 at 12:00 AM

Jennifer K. Robinson, FabTime, Inc.

ABSTRACT

FabTime is focused on improving wafer-fab cycle times through consulting, training, and our webbased digital dashboard software. For the past two years, we have conducted an informal survey of the roadblocks to great fab cycle-time performance. To date, the top response has been "equipment downtime". In this article, we discuss several best practices for improving fab cycle time by focusing on tool uptime. 

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22nd Edition: Real-time profile control: advanced process control for copper CMP Print E-mail
Jul 18, 2004 at 02:47 PM
Doyle Bennett, Jimin Zhang, Bogdan Swedek, Jeff David & Manush Birang, Applied Materials and Dick de Roover, SC Solutions

ABSTRACT

Real-time profile control (RTPC™) has been implemented for 300-mm copper CMP via closed-loop control of bulk copper removal, on a withinwafer (WIW) basis. The method uses a high-resolution sensor to measure the copper thickness across the wafer during polishing (in situ). The bulk copper-removal process is controlled via incremental changes to polishing conditions in situ, real-time using a multi-zone polishing head, the Titan Profiler™.Write Comment (0 comments)
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21st Edition: Robustness evaluation and improvement method for automated material handling systems Print E-mail
Feb 17, 2004 at 02:23 PM

R. Sturm & K. Reddig, Fraunhofer Institute Manufacturing Engineering and Automation Stuttgart, Germany. D. Glüer, Advanced Micro Devices Saxony LLC & Co. KG, Dresden, Germany

ABSTRACT

Planning and operating automated material handling systems (AMHS) for microelectronics and semiconductor manufacturing have become increasingly important for modern high-volume production lines. As a service system for the manufacturing process, reliable material supply to the process equipment is mandatory, and the scope of operating an AMHS is on the prompt. 

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