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Home arrow Product Briefings arrow Featured arrow New ‘cure’ for porous low-k film deposition
New ‘cure’ for porous low-k film deposition Print E-mail
Sep 27, 2005 at 07:33 PM
Product Briefing Outline: Applied Materials has unveiled the ‘Applied Producer Black Diamond II' system for depositing the advanced low-k film. Providing a k-value of  less than 2.5, the Black Diamond II system utilizes Applied's ‘NanoCure' UV(1) curing technology to achieve a robust, manufacturable film compatible with CMP(1) and packaging processes. According to the company, Black Diamond II enables the continued scaling of copper/lowk interconnects to 45nm and beyond.


Problem:
Low-k films will pose even more integration challenges than previously due to the need for the pores to be uniformly distributed throughout the film (x,y, and z dimensions) to maintain an isotropic dielectric constant, providing a predictable electrical performance. Pores must also be fully closed to prevent contamination
of the k value.

Solution: The Black Diamond II process involves the co-deposition of SiO backbone and organic species in a plasma enhanced chemical vapor deposition (PECVD) chamber. A UV cure is used to induce porosity and strengthen the SiO backbone. Small average pore size and tight distribution obviates the need for pore sealing. Curing also enhances the mechanical properties, enabling the film to withstand the rigors of process integration and packaging. The film is designed for k integrity and yield in a dual-damascene integration process. Ideally suited for advanced applications where
control of film interfaces is critical, the BD II chamber's single-wafer processing enables in-situ treatment and precise interface control with minimal impact to throughput. The resulting film provides an integration ready solution to meet the ILD requirement for
45nm/65nm high-performance and provides capability on the same hardware to reach k<2.2.

Applications:
Ultra low-k deposition, 65nm to 45nm.

Platform: The NanoCure chamber features a ‘snap on' UV lid/CVD lower chamber and in-situ chamber cleaning technology for high-volume manufacturability and Producer platform extendibility.

Availability:
July 2005 onwards.


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