Home
News
Blogs
Fabtech Jobs
Product Briefings
Going Places
300mm Activity Reports
Core Sections
Wafer Processing
Lithography
Fab management
Materials & Gases
Critical Components
Cleanroom
EHS
 
Find

GlobalSpec - The Engineering Search Engine
 
Home arrow EHS arrow Articles arrow Edition 18 - Published March 2003 arrow 18th Edition: Progress and challenges in PFC
18th Edition: Progress and challenges in PFC Print E-mail
Mar 21, 2003 at 12:05 PM

Dan Seif and Silke Hermanns, AMD

ABSTRACT

From 1995 to year-end 2001, Advanced Micro Devices, Inc. (AMD) achieved an 18% reduction in perfluorocompound (PFC) emissions as measured by carbon equivalents (CE) despite significant growth in manufacturing activity and revenue. This reduction was achieved via chemistry changes, gas use optimization, new technology implementation, legacy technology phase-out, and point-of-use abatement. While significant emission reductions have been made, new areas of PFC use and the projected growth of the industry present a continuing challenge. Of particular concern are PFC use in die packaging, single wafer pass etch chamber cleans, and post-etch residue stripping. Issues surrounding fugitive heat transfer fluid emissions and nitrous oxide are also presented. 

18th Edition: Progress and challenges in PFC reductions at AMD
Readers' comments



Bookmark with:
DeliciousDiggredditStumbleUpon

Visit Fabtech Jobs websiteSubscribe to Fabtech weekly newsletter

Related articles
18th Edition: Manufacturing productivity continuous improvement programmes  (21/03/2003)
18th Edition: Slurry metering for CMP  (21/03/2003)
18th Edition: IMEC and DHV cooperation  (21/03/2003)
18th Edition: Exposure tool strategy for 90nm~65nm production  (21/03/2003)
18th Edition: Photoresist issues for sub-100nm lithography  (21/03/2003)

Related jobs
PV Device Test Engineer/Scientist  (Santa Clara, 23/06/2008)
Senior Manufacturing Engineer  (, 31/01/2008)
Customer Engineer  (New Delhi, 12/11/2007)
Research Scientist   (Milpitas, 15/09/2007)
Senior Electrical Design Engineer  (San Jose, 09/08/2007)
Download
Subscribe
300mm