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Home arrow News arrow Wafer Processing arrow Jordan Valley acquires Bede X-Ray Metrology
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Jordan Valley acquires Bede X-Ray Metrology Print E-mail
Apr 16, 2008 at 11:28 AM

ImageBede X-Ray Metrology has been taken over by Israel-based Jordan Valley Semiconductor effective as of April 14th, 2008. Bede, a supplier of HRXRD metrology for the semiconductor industry, entered into the Administration phase at the end of March and its assets have now been taken over by Jordan Valley. 

Insolvency administrators have been appointed to oversee the company’s finances, and it is not expected that the administration will result in any return to equity shareholders.

Bede first announced that it was involved in preliminary takeover talks in July 2007.

By Síle Mc Mahon 


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