Metryx Limited will host the first technical seminar focused on the implementation of mass metrology in the production of advanced semiconductor devices in IMEC’s facilities in Leuven, Belgium. The one-day seminar will take place on April 8th, 2008. 

The program will feature speakers drawn from companies including Qimonda, ST Microelectronics and AMD, speaking on topics such as the implementation of mass metrology as an in-line, on-product wafer technique for monitoring process changes and excursions, and the role of mass metrology in the development of processes for advanced technology nodes.

“The seminar is the first step in maximizing the potential of the technology by providing a platform to share information and experiences from volume production scenarios,” said Mark Berry, Director of North America and Europe at Metryx. “Mass metrology is a versatile technology that offers real-time, on-product feedback that has become a critical wafer monitoring tool in the manufacturing process. We believe we are scratching the surface in terms of how beneficial mass metrology can be to process monitoring and process development and look forward to updating the semiconductor manufacturing community about current activity.”

Further information will be released in March 2008. In advance of the program release, Metryx is making a limited number of spaces available to the semiconductor manufacturing community. These reservations can be made by contacting and are available on a first-come, first served basis.