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Dongbu HiTek claims first to integrate yield & fault detection tool sets |
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Jan 24, 2008 at 02:04 PM |
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 Dongbu HiTek believes it is the first in the semiconductor industry to successfully integrate Yield Management System (YMS) and Fault Detection & Classification (FDC) tools as part of its wafer quality management operations. Dongbu HiTek has christened the new system Dongbu Early Trouble Detection and Analysis System (DETDAS), which it claims reduces fault detection and analysis from 2 to 3 days to less than one hour.
The company noted that approximately 60 technology personnel worked on the YMS/FDC tool integration over a seven-month period, with an investment of only $6 million in new software and hardware.
With more complex designs entering production, Dongbu expects even greater manufacturing cost savings due to improved wafer yields and process stability.
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