Product Briefing Outline: Xyalis has launched its
GTmask suite, which, it is claimed, is a fully integrated mask date
prep solution dedicated to complex wafer masks. Based on Xyalis’
existing tools, GTmask offers new capabilities fully meeting mask
teams’ demands, covering wafer assembly and floor-planning for chip
arrays, multi-project wafers and multi-layer reticles; CMP metal
filling; automatic frame generation; and optimized GDSII and jobdeck
files generation. The GTmask tool suite is part of Xyalis’ product
strategy aiming at establishing direct links between process data
management tools and SQL-based administration databases.
Problem: As process geometries are shrinking, mask
data preparation (MDP) complexity is soaring as well as databases
sizes, threatening to add extra delays into the design for manufacture
(DFM) flow. Adding to the MDP flow complexity, multi-project wafers
(MPWs) and multi-layer reticles (MLRs) services are now provided by
foundries to reduce mask costs. Xyalis (Grenoble, France) is the only
independent company offering to mask assembly teams a full line of
tools solving these issues.
Solution: Xyalis’
high end assembly tool handles the complete set of mask layers of a
chip; OASIS layers as well as GDSII layers; multi-project wafers
(assembling multiple GDSII/OASIS databases from different designs on
one wafer); any scale reticles (2.5X, 4X, 5X); and multi-layer reticles
(placing different layers of a same design onto a single reticle, with
automatic matricing). Added to the wafer map management tool, new
multi-criteria placement optimizations allow the user depending on his
current needs, to maximize the number of dies and/or to minimize the
number of shots. A manual fine tuning capability helps to handle the
frame and chip stepping, dynamically computing the number of dies and
photos. A graphic wafer description tool gives the user full control of
relevant parameters (notch, flat size & position, unusable
perimeter, forbidden areas…). Functions like chip grouping, and
automatic removal and query of chips and frames, help enhance the
user’s productivity. To increase manufacturability regarding the CMP
step, an option to fill empty spaces with dummy tiles is also
available. Dummy cells are customizable, as are insertion rules. Dummy
cells come as single OASIS/GDSII files, or as multiple files with
jobdeck files (placement directives for mask writing tools).
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Applications: Wafer assembly and floor planning for chip arrays, multi-project wafers and multi-layer reticles.
Platform: The
new GTframe module automatically inserts process and mask-specific
items (test structures, alignment marks or any GDSII files), for both
regular chip arrays and MPWs. Automatic frame instantiation is also
available for reticles, with the possibility to use mask templates.
Barcodes or titles are also inserted into the scribe lines, between the
chips of an MPW project or around the reticles. Xyalis tools now handle
both classical GDSII and newer OASIS chip layout database formats. The
GTmask tool suite is also able to read and write files in the MEBES
mask-writing format. This makes it easy to include GTmask into existing
flows. One of the key benefits of the GTmask tool suite is the safe
handling of large databases, including process description, imported
and merged GDSII databases validation, and layer management for complex
MPWs and MLRs. The next step will be to establish a direct link with
SQL databases for mask management and ordering applications.
Availability: May 2008 onwards.