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Home arrow Critical Components arrow Edition 18 - Published March 2003 arrow 18th Edition: Advanced technologies in CMP slurry sys...
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18th Edition: Advanced technologies in CMP slurry systems reduce wafer damage Print E-mail
Mar 21, 2003 at 02:41 PM

Scott Robichaud & Katsuhiro Ohnishi, Asahi

ABSTRACT

Chemical Mechanical Planarization (CMP) slurry systems have created many new challenges in the semiconductor fabrication industry.
Certain types of CMP slurries consisting of suspended solids in solution are abrasive, and traditional components used in wet process
systems, such as diaphragm valves, can damage these slurries.

18th Edition: Advanced technologies in CMP slurry systems reduce wafer damage
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