Online information source for semiconductor professionals

Seedless superfilling: Opportunities and challenges

Popular articles

Micron moving fast on Hynix in Q208 NAND flash rankings, says iSuppli - 19 August 2008

Micron close to Inotera share purchase, says Gartner - 06 October 2008

Numonyx to close California Technology Center - 12 August 2008

Applied Materials sees higher CapEx spending for 2009 - 15 August 2008

300mm Activity Report: 1st Quarter 2002 - 01 March 2002

Thomas P. Moffat & Daniel Josell, Materials Science and Engineering Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA

ABSTRACT

The continuing drive for device miniaturization calls for further improvements in metallization performance and fabrication. Substitution of certain refractory metals such as Ruthenium or Osmium for conventional Tantalum barriers offers the prospect of improved thermal and electrical performance along with process simplification by permitting seedless Cu superfilling. Close attention to the surface state of the refractory metal surface is required in order to assure successful implementation.

Download Please login to download the paper. No account yet? Please register. It's free!

Related jobs

System Engineer - ASML - Wilton, 09 August 2007

System Engineer - ASML - Wilton, 09 August 2007

Senior System Design Engineer - ASML - Wilton, 09 August 2007

Senior System Design Engineer - ASML - Wilton, 09 August 2007

Production Supervisor - ASML - Wilton, 09 August 2007

Related articles

Extending the Life of Existing Fabs Through Optimization - 01 March 1999

Electrochemical deposition challenges for 65nm - 01 March 2003

Major semiconductor test companies to merge - 23 June 2008

SEMATECH prepares 3D-IC workshop on manufacturing and reliability - 21 August 2008

Qimonda and Elpida team on sub-40nm DRAM development - 24 April 2008

Reader comments

No comments yet!

Post your comment

Name:
Email:
Please enter the word you see in the image below: