|
Project aims to directly observe 0.5 angstrom features |
|
|
|
Feb 04, 2005 at 05:00 PM |
FEI Company has been selected by the several laboratories that have
combined to form the TEAM project, as the R&D partner for building
the highest resolution scanning/transmission electron microscope
((S)TEM) in the world. TEAM is a multi-million dollar microscopy
project funded by the U.S. Department of Energy's (DOE) Office of Basic
Energy Sciences. The project calls for a new microscope that will
enable extraordinary new scientific opportunities for direct
observation and analysis of individual nanostructures at an
unprecedented resolution of 0.5 Angstrom -- approximately one-third the
size of a carbon atom - a key dimension for atomic level research.
In this unique project, five major electron microscopy efforts are
joining forces: Argonne National Laboratory, Brookhaven National
Laboratory, Lawrence Berkeley National Laboratory, Oak Ridge National
Laboratory and Frederick Seitz Materials Research Laboratory.
Each laboratory has a separate role in achieving the ambitious mission
to directly observe the atomic-scale order, electronic structure, and
dynamics of individual nanostructures, even in 3D. The proposed
microscope will also become a self-contained materials science lab for
in-situ analysis and characterization by facilitating unique
experiments across many scientific disciplines.
"FEI's new dedicated corrector platform is the most viable starting
point for the TEAM microscope because it is compatible with the
extraordinary stability needed in aberration-corrected instruments,"
stated Uli Dahmen, Scientific Director of TEAM and Head of NCEM
Berkeley.
Aberration corrected electron microscopy technology will be at the
heart of the TEAM microscope. The successful development of unique
aberration correctors is a key objective. Correctors will be designed
and developed in cooperation with CEOS, FEI's partner in advanced
corrector technology.
"We are extremely proud of the TEAM project's recognition of our
mission to deliver dedicated corrector microscopes working up to 300kV
for ultimate resolution in TEM and STEM on a routine basis," said
George Scholes,Vice President for FEI's (S)TEM business line.
|
News 
