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Home arrow News arrow Lithography arrow Japanese fab selects 193nm molecular contamination monitors from Extraction
Japanese fab selects 193nm molecular contamination monitors from Extraction Print E-mail
Feb 04, 2005 at 05:00 AM
Extraction received an order for multiple TMB-193 real-time total molecular base monitors from a leading semiconductor producer in Japan. The customer chose the TMB-193 systems to support its need to continuously monitor for molecular ontamination in 193nm lithography tools and production areas.

"With low K1 193nm photoresist processing, we've got the perfect storm: thinner more sensitive resists, longer double exposures, sub 10nm CD budgets, and new amines in the manufacturing process," said Devon Kinkead, president and CEO of Extraction. "As a result, our customers can not afford contamination ‘blind spots'. The TMB-193 answers this challenge by continuously detecting and measuring contaminants of concern and we are honored to serve this leading Japanese chipmaker with our just released TMB-193 process monitoring technology."

The TMB-193 uses chemiluminescence, a highly reliable, accurate and rugged detection technology not found in competing monitors, according to the company. Extraction developed the system in conjunction with a companion periodic monitoring tool - the LithoScout sampling and reporting system.

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