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Home arrow Blogs arrow Chip Shots arrow Blogs arrow Destroy all defects!
Destroy all defects! Print E-mail
Oct 12, 2006 at 09:02 AM
S cott Hiemke of Texas Instruments had a great line during his ISMI presentation on a methodology for in-line partial die inspection for edge yield improvement.
"When you're a yield engineer and you find a defect, it's your job to kill it."

Some defects just don't deserve to live.


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