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Home arrow News arrow Lithography arrow Chartered Semiconductor validating Takumi’s DFM software for 65nm & 45nm
Chartered Semiconductor validating Takumi’s DFM software for 65nm & 45nm Print E-mail
Sep 19, 2007 at 05:53 PM

TakumiTakumi Technology has said that Chartered Semiconductor is working to validate Takumi's design-for-manufacturing (DFM) optimization software for process implementation of Common Platform technology for the 65nm node and preparing qualification at the 45nm node. 

"Chartered is encouraged by our early, collaborative results with Takumi, and its potential direct benefit to customers from improved variation control to reduced violations, helping them to better meet their time-to-market windows," said Mr. Henry Law, Vice President of the design services division at Chartered. "As Chartered and Takumi move toward customer engagements at 65nm, we are also proceeding with qualification at 45nm."

“Takumi's unique solution can detect layout problems due to multiple yield-loss mechanisms and automatically optimize the layout to improve performance and silicon yield," noted Mr. Akifumi Goto, CEO and President of Takumi.
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