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Nanometrics said in a brief statement that it had acquired Tevet
Process Control Technologies, an Israel-based film thickness integrated
metrology (IM) tool supplier. The deal was an all-cash transaction but
further details were not disclosed.
Tevet was supported by venture capital funding. In July 2007 the
metrology company had raised over $13 million to support the
development of its Trajectory T3 film thickness integrated metrology
product line that was used in PECVD processes.
“The new IM
products are differentiated and highly complementary to our IM
business,” commented Steve Bradley, Director of the Integrated
Metrology Business Unit at Nanometrics. “This represents an additional
entry point for us with leading semiconductor OEMs, as well as
companies in the solar manufacturing industry.”