 Carl Zeiss SMT and SII NanoTechnology (SIINT), a subsidiary of Seiko Instruments Inc., have opened their joint Yokohama Nanotechnology Demonstration Center as part of the global strategic alliance of Carl Zeiss SMT and SIINT announced in March 2006.
The Demonstration Center includes the electron and ion beam products of both companies, namely Scanning Electron Microscopes (SEM), Focused Ion Beam systems (FIB), FIB-SEM Hybrid Systems as well as Transmission Electron Microscopes (TEM). The Yokohama Demonstration Center comprises a total of 430 square meters for 5 demonstration laboratories, meeting rooms, training and office space. The instrumentation available for demonstration and Customer training currently comprises NVision 40 CrossBeam®, ULTRA 55 SEM, SUPRA™ 40 VP SEM and SMI 3050 FIB station, with additional equipment to follow, according to the companies. 
Caption:
More than 50 guests took part in the inauguration of the new Nanotechnology Demonstration Center of Carl Zeiss SMT and SIINT in Yokohama. Front row, center: Dr. Dirk Stenkamp, Member of the Board, Carl Zeiss SMT AG; left hand: Minister Stefan Gallon, Head of Economic and Scientific Services - Embassy of the Federal Republic of Germany, Tokyo; right hand: Dr. Hiroyuki Funamoto, President & CEO SII Nano Technology.
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