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Home arrow News arrow Lithography arrow Japan’s STARC center selects Blaze DFM for leakage power optimization
Japan’s STARC center selects Blaze DFM for leakage power optimization Print E-mail
Jan 24, 2007 at 03:31 PM
Blaze2The Semiconductor Technology Academic Research Center (STARC) of Japan has selected Blaze DFM's software targeting low-power reference flows for 65nm and below designs by STARC members.

"For many of our member companies, power has become the most critical yield-limiting factor for their designs," said Nobuyuki Nishiguchi, vice-president and general manager at STARC. "A reduction in leakage power of this magnitude, in addition to what is already achievable using more conventional techniques, adds significant value to any design flow for 65nm or below."

Blaze DFM has claimed that on 90nm and 65nm designs, customers have seen leakage power reductions of more than 40 percent and reduced leakage variability by up to 60 percent with timing improvements of 10 percent and above.
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