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New Product: Micro Photonics’ Sarfus visualization technology boosts microscope sensitivity |
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Nov 24, 2006 at 10:59 AM |
 Product Briefing Outline: Micro Photonics Inc. has launched its new Sarfus visualization technology, a new optical quantitative imaging technique for highly precise 3D thickness, dimensional, roughness, profile and step height measurements. Sarfus visualization is based on the perfect control of the reflection properties of polarized light on a Surf (specific supporting plates where the sample is deposited), which leads to an increase in the axial sensitivity of the optical microscope by a factor of approximately 100 without reducing lateral resolution, according to the company. Specific optical properties can be manipulated by controlling the layers deposited on the substrate, and can be customized with specific top layers such as SiO2, Au, Cr or Al.
Problem: Sarfus visualization results from a significant increase of optical microscope sensitivity. To improve this sensitivity, the technique enhances the contrast of the object as compared to the background by minimizing the background intensity.
Solution: Using an upright optical microscope and a Surf, a white light beam passes through a linear polarizer which produces a linear polarized light that is reflected by the Surf. The sample induces a change of the polarization state. When the reflected beams pass through an analyzer crossed with the polarizer, the light reflected from the surf is stopped, while the light reflected from the sample passes through. An infinitesimal quantity of matter deposited on the surface of the Surf changes the property (i.e. modifies the polarization state) and reveals the sample. The resulting high-contrast images allow direct observation of nanometric thickness films or nanometric diameter objects. 2D images can be converted into highly precise 3D metrological images, with dimensional accuracy at <1nm. Roughness, profile extraction and step height measurements are also easily imaged.
Applications: Direct behavior and morphology characterization of nanotubes and nanowires, and direct visualization of nanolithography patterns.
Platform: Sarfus technology can be either integrated onto AFM or RAMAN spectroscopy tools with a ‘plug and play' solution, or purchased as part of a total acquisition system.
Availability: October 2006 onwards.
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