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Home arrow Wafer Processing arrow Articles arrow Edition 12 arrow 12th Edition: ECD Seed Layer for Inlaid Copper Metallisatio...
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12th Edition: ECD Seed Layer for Inlaid Copper Metallisation Print E-mail
Feb 03, 2005 at 01:58 PM
L. CHEN & TOM RITZDORF, Semitool Inc.Kalispell, Montana, USA and HEN & TOM RITZDORF, Semitool Inc., Kalispell, Montana, USA

ABSTRACT

A novel approach is presented in this paper for inlaid copper metallisation. Contrary to the traditional approach regarding seed layer application, an ultra-thin copper flash layer, serving as an adhesion layer, is deposited by a PVD process. This flash adhesion layer is conformally enhanced from Semitool's specially formulated plating solutions by electroplating. The ECD seed layer is then used as a base for copper deposition from an acid copper sulfate plating bath. The advantage of depositing an ultra-thin copper flash adhesion layer and ECD seed layer, rather than a relatively thick PVD copper seed layer, is that pinching off of small trenches or vias can be avoided, while ensuring adequate sidewall coverage.
icon ECD Seed Layer for Inlaid Copper Metallisation

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