Product Briefing Outline: Synopsys and Hitachi
High-Technologies have developed a seamless link between Hitachi
High-Tech's DesignGauge design data measuring system and Synopsys'
Proteus optical proximity correction (OPC) solution. Focused on
incorporating manufacturing-aware metrology data into design, this
common design for manufacturing (DFM) interface assists in the
development of faster, more accurate and predictive OPC models for
advanced 45nm and beyond technologies. Higher OPC model predictability
and reduced model-building cycle times are also achievable. This new
functionality is available in the latest production release of Proteus.
Problem: As process geometries continue to shrink to
45nm and beyond, the ability to deliver accurate OPC models that meet
the stringent critical-dimension (CD) error budget across the process
window plays an increasingly critical role in accelerating mask
time-to-yield. Process window models must account for the wide range of
process variation and complex two-dimensional (2D) structures. This
becomes even more important with the use of multiple resolution
enhancement techniques (RETs) for advanced semiconductor manufacturing.
Solution:
Combining leading-edge metrology information from Hitachi High-Tech
with Proteus mask-synthesis data sharpens OPC model accuracy and
predictability at 45 nanometers and beyond. The automated algorithmic
link between DesignGauge, the application system for CD scanning
electron microscopy (CD-SEM), and Proteus OPC for pre-processing OPC
model building data allows Proteus customers to seamlessly obtain a
large sampling of metrology data to account for process variations
across the entire process window.
Applications: 45nm node and below.
Platform:
Proteus, the core correction-processing engine, combines a hierarchy
manager with proprietary, high-speed simulation algorithms. Proteus is
typically parallelized across clusters of computers enabling full-chip
corrections and compact output files.
Availability: June 2007 onwards.