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UMC validates high-k metal-gate process for 32/28nm nodes
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UMC has said that it has produced working 45nm SRAM test chips using its high-k/metal-gate (HKMG) process technology. According to UMC, this is a major step in validating the technology for inclusion at the 32/28nm nodes.
“UMC is making steady progress in bringing our HK/MG process towards 32/28nm pilot production so that our customers can benefit from the performance advantages of this technology,” said Mr. S.C. Chien, vice president of Advanced Technology Development at UMC. “Despite the global economic uncertainties, UMC continues to move full speed ahead with our advanced technology R&D efforts. With our recent achievement of working 28nm SRAM, coupled with this latest HK/MG process material validation, we are well positioned to offer customers a strong technology platform solution when our 32/28nm technology becomes available in 2010.”