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Nova Instruments to acquire x-ray metrology company |
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Apr 25, 2006 at 06:30 PM |
 Nova Measuring Instruments, plans to acquire held HyperNex, Inc a manufacturer of X-Ray Diffraction (XRD) metrology tools. The all share transaction is valued at around $4.5 million US dollars.
Nova is hoping the deal can be closed sometime during May and would be expected to account for about 10% of Nova's revenue in 2006, and the transaction is expected to be accretive to full-year earnings on a pro-forma basis, according to the company.
"HyperNex is an excellent fit with Nova," stated Dr. Giora Dishon, President and CEO of Nova Measuring Instruments, "It will strengthen our offering in the high-end stand-alone metrology market and expands our array of process control solutions. HyperNex's X-Ray-based process control capabilities complement our Spectrophotometry and Scatterometry based solutions, which will enable us to provide complete metrology solutions for critical steps such as gate structures and copper interconnect."
Nova sees the acquisition as complementary technology to its current range of metrology based products and would utilise Nova's sales and marketing channels to better effect.
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