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Tool Order: Wafer supplier places multiple tool order with ADE |
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Apr 13, 2006 at 09:24 AM |
 A silicon substrate wafer supplier has placed a multi-million US dollar order for 300mm wafer metrology systems with ADE Corporation. The order is for the customers first 300mm wafer growing facility established in the US, according to ADE.
The order includes wafer quality certification and process control systems, as well as wafer geometry measurement, surface inspection and defect classification, and ADE's new ‘FabVision' yield management and database system. Delivery of these tools is expected to be completed in calendar 2006.
"This multi-million dollar order, encompassing ADE's broad range of in-line wafer metrology, inspection and yield management products continues to reflect the growth of 300mm wafer capacity and represents the first expansion of 300mm silicon wafer production in the United States," said Dr. Chris L. Koliopoulos, ADE's president and chief executive officer. "Through the adoption of this tool set by this major wafer supplier, ADE is committed to help the customer ramp up 300mm wafer production in a timely manner, to successfully achieve its yield entitlements for this initial investment in the United States."
ADE is currently in the process of being acquired by KLA-Tencor and expects the merger to close by early in the third calendar quarter 2006.
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