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Tool Orders: BASF orders FIB/SEM tool from FEI for nano-particle R&D |
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Mar 06, 2006 at 02:37 PM |
 BASF has ordered FEI's "DualBeam Strata 400," combined focused ion beam and scanning electron microscope system to be used for advanced R&D of nano-particles for a wide range of industrial applications. The order comes on the back of previous order for FEI's "Tecnai" transmission electron microscope.
"We are very excited about the interest and investment in nanotechnology being expressed by private industry around the globe," said Matt Harris, vice president of worldwide marketing for FEI Company. "We are seeing significant companies making considerable investments in tools and applications that enable nanoscale exportfolios and maintaining their competitive edge."
BASF's total R&D investment for 2006 is expected to be in the region of 1.15 billion Euros with around 75 percent targeting nanotechnology fields.
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