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300mm Report
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 Date Item Title Hits
Oct 19, 2006 at 06:44 PM New Product: Optimize 300mm fab tool scheduling every 5 minutes offered by ILOG’s Fab PowerOps 1505
Oct 19, 2006 at 04:48 PM New Product: Thermocouple sensor from Partek improves lifetime reliability 1503
Oct 18, 2006 at 12:38 PM New Product: Synopsys takes care of strain engineering in DFM 1435
Oct 10, 2006 at 03:05 PM New Product: PDF Solutions upgrades parametric yield analysis of analog and RF IC designs 1682
Oct 04, 2006 at 05:45 PM New Product: Low temp CVD offered for nickel silicide contacts by TEL 1611
Oct 03, 2006 at 04:41 PM New Product: Mattson enters rapid thermal oxidation market with Atmos RTP tool 1657
Sep 25, 2006 at 02:11 PM New Product: Applied Materials employs ‘virtual sensors’ in new APC platform 1207
Sep 25, 2006 at 01:59 PM New Product: GAMMA Express dry strip system from Novellus tackles sub 65nm resist removal 1554
Sep 25, 2006 at 10:42 AM New Product: ASML’s ‘TWINSCAN’ XT:1900i near limit of immersion capabilities 1769
Sep 25, 2006 at 10:35 AM New Product: Carl Zeiss SMT’s Starlith 1900i pushes limits of catadioptric lenses 1435
Sep 25, 2006 at 10:22 AM New Product: Cost saving copper abatement for CMP tools offered by Metron 1183
Sep 22, 2006 at 05:26 PM New Product: Brion’s new Tachyon M3D accounts for 3D imaging effects on photomasks 1553
Sep 21, 2006 at 09:16 AM New Product: Varian Semiconductor offers high current implant for 65nm on VIISta platform. 1451
Sep 20, 2006 at 04:56 PM New Product: FEI’s new V600FIB platform meets cost & performance issues for failure analysis 1295
Sep 20, 2006 at 04:17 PM New Product: GF Piping’s new butterfly valve suits corrosive environments 1457
Sep 20, 2006 at 10:54 AM New Product: Nikon’s NSR-S610C immersion tool uses 1.30 NA catadioptric lens for sub-45nm patterning 1792
Sep 19, 2006 at 06:14 PM New Product: Electroplated metals abatement from BOC Edwards manages waste 1241
Sep 18, 2006 at 04:52 PM New Product: Invarium offers ‘wet’ versus ‘dry’ lithography patterning synthesis trade-offs: 45-32nm 1335
Sep 18, 2006 at 04:04 PM New Product: Brooks Software enhances FACTORYworks to interoperate at enterprise-level on Windows 1227
Sep 18, 2006 at 03:38 PM New Product: Straatum upgrades FDC software to virtual metrology status 1438
Sep 15, 2006 at 02:28 PM New Product: Novellus targets SABRE Extreme Electrofill tool at 45nm & below 1873
Sep 15, 2006 at 12:52 PM New Product: Line edge roughness reduction at 45nm on Applied’s Producer APF-e system 1961
Sep 12, 2006 at 04:30 PM New Product: High precision substrate-thickness metrology system launched by ISIS sentronics 1719
Aug 29, 2006 at 07:17 PM New Product: Compact LIQUOZON’ LoopO3 from MKS designed for single wafer cleaning tools 1772
Aug 29, 2006 at 06:57 PM New Product: Closed-loop digital ionization sensor from MKS Instruments handles static issues in EFE 1815
Aug 29, 2006 at 06:17 PM Problem: Surface preparation is needed between every, etch (or implant) and deposition step. Convent 2036
Aug 29, 2006 at 05:57 PM New Product: Advance lithography lens analysis and correction software from Litel Instruments boosts 1903
Aug 29, 2006 at 04:51 PM New Product: BlueShift Technologies offers innovative linear vacuum wafer handling system 1921
Aug 29, 2006 at 04:24 PM New Product: Electrical DFM issues handled by Blaze DFM’s optimization software 1905
Aug 29, 2006 at 03:49 PM New Product: Enhanced ferrofluid magnetic liquids from Ferrotec boost critical sealing applications 2124
Aug 29, 2006 at 03:29 PM New Product: Nova offers 2D/3D modeling on high throughput NovaScan 3090Next platform 1883
Aug 23, 2006 at 07:01 PM New Product: Advanced Energy’s new line of Sekidenko OFT’s provide precise temperature control 1911
Aug 23, 2006 at 06:28 PM New Product: New DFM suite from Synopsys aims to shorten correction, correlation & completion tasks. 1600
Aug 22, 2006 at 02:26 PM New Product: Poly silicon furnace liner from Integrated Materials cuts particle defect levels 2185
Aug 21, 2006 at 11:56 AM New Product: Axcelis’ Imax high dose, low energy boron cluster implant tech added to Optima platform 2228
Aug 21, 2006 at 11:34 AM New Product: Carl Zeiss SMT and SII Nano’s XVision 300 creates 3D defect analysis at the nano range 2580
Aug 18, 2006 at 11:39 AM New Product: ATMI launches dedicated copper chemistry solution for 45nm processes 1786
Aug 17, 2006 at 05:19 PM New Product: Olympus launches defect review system for complete macro 300mm wafer coverage 1856
Aug 17, 2006 at 04:13 PM New Product: LiquidLens UPW purification system from Entegris designed for immersion lithography 1744
Aug 17, 2006 at 03:38 PM New Product: GES5 Evolution from Sopra covers UV to near Infra-Red spectrum 1535
Aug 17, 2006 at 03:29 PM New Product: GES5 Evolution from Sopra covers UV to near Infra-Red spectrum 1150
Aug 17, 2006 at 03:10 PM New Product: Applied Endura CuBS PreClean system preserves integrity of ultra-low k films 1796
Aug 17, 2006 at 02:07 PM New Product: Applied Materials Endura’ iLB II tackles 45nm liner/barrier challenges 2331
Aug 17, 2006 at 01:35 PM New Product: TEL provides high speed probe mark inspection analysis with new TELPADS-O. 1511
Aug 17, 2006 at 12:21 PM New Product: Timbre Technologies improves CD profile shape metrology 1944
Jun 29, 2006 at 04:31 PM New Product: PoU abatement system from TecHarmonic reaches 95 percent DRE 2473
Jun 22, 2006 at 01:54 PM New Product: Applied Materials employs ‘virtual sensors’ in new APC platform 2215
Jun 19, 2006 at 03:56 PM New Product: Entrepix starts ‘FastForward’ CMP foundry service 2603
Jun 14, 2006 at 12:58 PM New Product: Ultrapure water lab level analysis for production applications 2043
Jun 14, 2006 at 12:54 PM New Product: ChemTek gloves designed for HazMat operations 2265
 
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